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- //
- // Unit tests for the AP_Common code
- //
- #include <AP_Common/AP_Common.h>
- #include <AP_HAL/AP_HAL.h>
- void setup();
- void loop();
- void test_high_low_byte(void);
- const AP_HAL::HAL& hal = AP_HAL::get_HAL();
- void test_high_low_byte(void)
- {
- // test each value from 0 to 300
- for (uint16_t i = 0; i <= 300; i++) {
- uint8_t high = HIGHBYTE(i);
- uint8_t low = LOWBYTE(i);
- hal.console->printf("\ni:%u high:%u low:%u", (unsigned int)i, (unsigned int)high, (unsigned int)low);
- }
- // test values from 300 to 65400 at increments of 200
- for (uint16_t i = 301; i <= 65400; i += 200) {
- uint8_t high = HIGHBYTE(i);
- uint8_t low = LOWBYTE(i);
- hal.console->printf("\ni:%u high:%u low:%u", (unsigned int)i, (unsigned int)high, (unsigned int)low);
- }
- }
- /*
- * euler angle tests
- */
- void setup(void)
- {
- hal.console->printf("AP_Common tests\n\n");
- test_high_low_byte();
- }
- void loop(void)
- {
- // do nothing
- }
- AP_HAL_MAIN();
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